Instrumentation Division overview


Mission

Develop state-of-the-art instrumentation for current and future Laboratory programs


Established

1948


Division Head

Graham Smith


Staff

  • 16 Scientific
  • 3 Post Doctoral
  • 8 Professional
  • 13 Technical
  • 4 Administrative


Research Areas

  • Semiconductor detectors
  • Gas and Noble liquid detectors
  • Microelectronics
  • Lasers and Optics
  • Micro/Nano fabrication


Facilities

  • Clean rooms for semiconductor processing (Class 100) and detector fabrication
  • Laser and optics laboratories
  • Hybrid and integrated circuit design and testing
  • Microfabrication and electron microscopy laboratory
  • Printed circuit fabrication
  • Irradiation facility


Highlights of Accomplishments

  • Gas detectors, electronics - (1948)
  • Fast(µs) transistorized electronics for physics experiments - (1956)
  • First Si detectors, nanosecond electronics - (1960)
  • Positron emission tomography detector - (1960)
  • Germanium detectors, low noise electronics - (1965)
  • LAr ionization chambers for calorimetry - (1973)
  • Detectors for neutron scattering - (1976)
  • Optical metrology - (1979)
  • Electron microscopy, MEMS - (1980)
  • First synchrotron X-ray detectors - (1982)
  • Silicon drift detector invented - (1983)
  • Cryogenic electronics - (1984)
  • Lasers in accelerator technology - (1985)
  • Si detectors for HEP/NP - (1986)
  • Gas detectors for heavy ion physics - (1986)
  • Long Trace Profiler - (1987)
  • Monolithic low-noise circuits - (1990)
  • LAr, LKr ionization chambers, SSC, LHC: - (1993)
  • Nanostructures - (1994)
  • Deep sub-micron low-noise circuits - (1997)
  • Ultrafast optical techniques - (2000)
  • Neutron/Gamma detectors for Homeland Security - (2002)
  • Small animal imaging - (2003)
  • Silicon detectors for synchrotron radiation - (2004)
  • LSST: Lead for focal plane sensor array - (2005)
  • Beam diagnostics - (2006)
  • Neutrino Experiments (MicroBoone, LBNE) - (2009)
  • Low Temperature Microelectronics - (2010)


Patents

  • Surface profiling interferometer/ US Patent# 4884697 - (1989)
  • Low noise charge sensitive preamplifier DC stabilized without physical resistor / US Patent# 5347231 - (1994)
  • Monolithic amplifier with stable, high resistance feedback element/ US Patent# 5793254 - (1998)
  • Photon generator/ US Patent# 6459766 - (2002)
  • Offset-free rail-to-rail deramdomizing peak detect and hold circuit/ US Patent# 6512399 - (2003)
  • Method of surface preparation of Niobium/ US Patent# 6524170 - (2003)
  • Method for fabricating a high aspect ratio microstructure/ US Patent# 6558868 - (2003)
  • Beam splitter and method for generating equal optical path length beams/ US Patent# 6611379 - (2003)
  • Method and apparatus for linear low-frequency feedback in monolithic low noise charge amplifiers/ US Patent# 6998913 - (2006)
  • Method and apparatus for clockless A-D conversion and peak detection/ US Patent# 7187316 - (2007)
  • Secondary emission electron gun using external primaries/ US Patent# 7227297 - (2007)
  • Device and method for measurement of depth of interaction using coplanar electrodes/ US Patent# 7271395 - (2007)
  • Method and apparatus for signal processing in a sensor system used in spectroscopy/ US Patent# 7378637 - (2008)
  • Secondary emission electron gun using external primaries/ US Patent# 7601042 - (2009)
  • Multi-anode ionization chamber/ US Patent# 7858949 - (2010)


Total Laboratory/Office Space

36,000 sq. feet




Last Modified: Wednesday, 13-Feb-2013 12:21:41 EST