Instrumentation Publications - 1995



  1. P. Z. Takacs and E. L. Church; Surface Texture - Chapter 8; BNL ; Handbook of Optical Standards, R. E. Parks and R. Kimmel, eds.; pp. 50-62, Optical Soc. America, Washington, DC (1995)

  2. E. L. Church and P. Z. Takacs; Surface Scattering; BNL 60916; Handbook of Optics, Vol. 1, pp. 7.1-7.14, McGraw-Hill, Inc. (1995), Michael Bass, ed., (1995),
  3. Zheng Li; Investigation on the Long-term Radiation Hardness of Low Resistivity Starting Silicon Materials for Silicon Detectors in High Energy Physics; BNL 60155; pres. at Frontier Detectors for Frontier Physics, 6th Pisa Meeting on Advanced Detectors, Elba, Italy, 22-28 May (1994); Nucl. Instrum. & Meth. A360, p. 445 (1995).

  4. V. Eremin, Z. Li, and I. Ijashenko; Trapping Induced Neff and Electrical Field Transformation at Different Temperatures in Neutron Irradiated High Resistivity Detectors; BNL 60154; pres. at Frontier Detectors for Frontier Physics, 6th Pisa Meeting on Advanced Detectors, Elba, Italy, 22-28 May (1994); Nucl. Instrum. & Meth. A360, p. 458 (1995).
  5. V. Eremin, N. Strokan, E. Verbitskaya, and Z. Li; The Development of Transient Current and Charge Techniques for the Measurement of Effective Impurity Concentration in the Space Charge Region of p-n Junction Detectors; BNL 60156; Nucl. Instrum. & Meth. A372 (1996) 388-398.

  6. V. Eremin, A. Ivanov, E. Verbitskaya, Z. Li, and H. W. Kraner; Elevated Temperature Annealing of the Neutron Induced Leakage Current and Corresponding Defect Levels in Low and High Resistivity Silicon Detectors; BNL 60273; pres. 1994 Nuclear Science Symp., Norfolk, VA, 10/30-11/4/94; IEEE Trans. Nuc. Sci. NS-42, No. 4, August (1995) 387.
  7. Zheng Li; Experimental Comparisons Among Various Models for the Reverse Annealing of the Effective Concentration of Ionized Space Charges (Neff) of Neutron Irradiated Silicon Detectors; BNL 60274; pres. 1994 Nuclear Science Symp., Norfolk, VA, 10/30-11/4/94; IEEE Trans. Nucl. Sci. NS-42, No. 4, August (1995) 224.
  8. Z. Li, W. Chen, V. Eremin, H. W. Kraner, G. Lindstroem, and E. Spiriti; Study of the Long Term Stability of the Effective Concentration of Ionized Space Charges (Neff) of Neutron Irradiated Silicon Detectors Fabricated by Various Thermal Oxidations; BNL 60294; pres. at 1994 Nuclear Science Symp., Norfolk, VA, 10/30-11/4/94; IEEE Trans. Nuc. Sci. NS-42, No. 4, August (1995) 219.
  9. T. Srinivasan-Rao, J. Fischer, and T. Tsang; Photoemission from Mg Irradiated by Short Pulse Ultraviolet and Visible Lasers; BNL 60388; J. Appl. Phys. 77, 1275-1279 (1995).
  10. G. Smith and B. Yu; The Linearity Performance of a Two-Dimensional, X-ray Proportional Chamber with 0.58 mm Anode Wire Spacing; BNL 52423; pres. 1994 Nuclear Science Symp., Norfolk, VA, 10/30-11/5/94; IEEE Trans. Nuc. Sci. NS-42 (1995) 541-547., Full Paper available online.
  11. A. Pullia, H. W. Kraner, D. P. Siddons, and G. Bertuccio; Silicon Detector System for High Rate EXAFS Applications; BNL 60405 (abstract only); pres. 1994 Nuclear Science Symp., Norfolk, VA, 10/30-11/5/94; IEEE Trans. Nucl. Sci. NS-42 (1995)585-589.

  12. T. Tsang and V. Radeka; Electro-optical Modulators in Particle Detectors; BNL 60823; Rev. Sci. Instrum. Vol 66(7) pp. 3844-3854, July (1995).
  13. E. L. Church, P. Z. Takacs, and John C. Stover; Profiling and Light Scattering Studies of Si Surfaces; BNL 60904; Microphysics of Surfaces: Nanoscale Processing Meeting, Santa Fe, NM, 9-11 February (1995); not published.

  14. E. L. Church and P. Z. Takacs; Specification of Glancing- and Normal-incidence X-ray Mirrors; BNL 60895; Optical Engr. 34(2), 353-360, Feb. (1995).

  15. Shinan Qian, Werner Jark, Peter Z. Takacs, Kevin J. Randall, and Wenbing Yun; In-Situ Surface Profiler for High Heat Load Mirror Measurement; BNL 60897; Optical Engr. 34(2), 396-402, Feb. (1995).

  16. E. L. Church and P. Z. Takacs; Specification of the Figure and Finish of EUV Mirrors in Terms of Performance Requirements; BNL 60902; Optical Soc. of America Topical Mtg. on Extreme Ultraviolet Lithography, Monterey, CA, 19-21 September (1994); Proc. of Mtg. on Extreme Ultraviolet Lithography, Vol. 23, pp. 77-82 (1995).
  17. Mauro Citterio, Sergio Rescia, and Veljko Radeka; Radiation Effects at Cryogenic Temperatures in Si-JFET, GaAs MESFET and MOSFET Devices; BNL 61049; Pres. 1994 Nucl. Sci. Symp., Norfolk, VA, (10/30-11/5/94); IEEE Trans. Nucl. Sci. NS-42, No. 6 (1995) 2266-2270.

  18. Paul O'Connor; Low-Noise CMOS Signal Processing IC for Interpolating Cathode Strip Chambers; BNL 61085; pres. 1994 Nucl. Sci. Symp., Norfolk, VA, (10/30-11/5/94); IEEE Trans. Nucl. Sci. NS-42, August (1995) 824-829.
  19. B. Yu, G. C. Smith, and V. Radeka; Recent Developments in Interpolating Cathode Strip Readout for High Precision, Gas Proportional Detectors; (abstract & summary); BNL 61146; pres. 1995 Wire Chamber Conf., Vienna, Austria, 13-17 February (1995); not published.,

  20. M. S. Capel, G. C. Smith, and B. Yu; One- and Two-Dimensional X-ray Detector Systems at NSLS Beam-Line X12B, for Time Resolved and Static X-ray Diffraction Studies; BNL 61180; pres. 5th Int'l. Conf. on Synchrotron Radiation Instrumentation, Stony Brook, NY; 18-22 July (1994); Rev. Sci. Instr. 66 (1995) 2295-2299., Full Paper available online.

  21. S.-N. Qian, W. Jark, and P. Z. Takacs; The Penta-Prism LTP: A Long-Trace Profiler with Stationary Optical Head and Moving Penta-Prism; BNL 61213; pres. 5th Int'l. Conf. on Synchrotron Radiation Instrumentation, Stony Brook, NY; 18-22 July (1994); Rev. Sci. Instr. 66 (3), pp. 2562-2569 (1995).
  22. V. Radeka; Liquid Krypton in High Resolution Sampling EM Calorimetry; BNL 61319; pres. Wire Chamber Conf., Vienna, Austria, 13-17 February (1995); (not published).

  23. C. J. Li and Z. Li; Development of Current Based Microscopic Defect Analysis Methods and Associated Optical Filling Techniques for the Investigation on Highly Irradiated High Resistivity Silicon Detectors; BNL 61325; Nucl. Instr. & Meth. A364 108 (1995).
  24. V. Radeka, M. Citterio, S. Rescia, P. F. Manfredi, and V. Speziali; Low Noise Monolithic Si JFETs for Operation in the 90-300 K Range and in High Radiation Environments; BNL 61328; pres. Low Temperature Electronics and High Temperature Superconductivity, Reno, NV, 21-26 May (1995); Proc. Symp. on Low Temperature Electronics & High Temperature Superconductivity, C. L. Claeys, S. I. Raider, R. Kirschman, and W. D. Brown, eds., pub. by The Electrochemical Soc., Inc., Pennington, NJ; Vol. 95-9, pp. 418-427 (1995).
  25. Anand Kandasamy; Irradiation Study on GEM IPC Preamp/Shaper (informal report); January, (1995); BNL 61333; (not published).

  26. Haizhang Li, Xiaodan Li, Manfred W. Grindel, and Peter Z. Takacs; Metrology for X-ray Telescope Mirrors in a Vertical Configuration; BNL 62034; Pres. at 1st Regional Symp. on Manufacturing Science & Technology, College of Engineering & Applied Science, SUNY, Stony Brook, NY, 10/12-13/95; not published.

  27. Thomas Y.F. Tsang; Optical Third Harmonic Generation at Interfaces; BNL 62062; Phys. Rev. Sec. A, Vol. 52, p. 4116 (1995).

  28. E. L. Church and P. Z. Takacs; Light Scattering from Non-Gaussian Surfaces; BNL 61326; pres. SPIE-Int'l. Soc. for Optical Engineering International Symp. on Optical Science, Engineering, and Instrumentation, 13-14 July (1995), San Diego, CA; Proc. SPIE; Vol. 2541, J. C. Stover, ed. (1995).
  29. S. U. Pandey, G. Vilkelis, T. J. Humanic, H. Kraner, R. Bellwied, A. French, and J. Hall; Studies of Ionizing Radiation Effects on Silicon Drift Detectors; BNL 62074; Nucl. Instrum. & Meth. A361 (1995) 457-460.
  30. Shinan Qian, Werner Jark, Peter Z. Takacs, Kevin J. Randall, Zhongde Xu, and Wenbing Yun; In-Situ Long Trace Profiler for Measurement of Mirror Profiles at Third Generation Synchrotron Facilities; (abstract); BNL 62082; Pres. SRI'95 Int'l. Conf. on Synchrotron Radiation Instrumentation; Argonne Nat'l. Lab., Argonne, IL, 18-20 October (1995); (not published).

  31. Haizhang Li, Xiaodan Li, Manfred W. Grindel, and Peter Z. Takacs; Measurement of X-ray Telescope Mirrors Using a Vertical Scanning Long Trace Profiler; BNL 62117; sub. Optical Engineering (8/95); Opt. Eng. 35 (2) pp. 330-338.

  32. M. Babzien, I. Ben-Zvi, J. Fischer, A. S. Fisher, K. Kusche, I. V. Pogorelsky, and T. Srinivasan-Rao; A High-Power Picosecond Nd:YAG/CO2 Laser System for Electron Guns, Laser Acceleration and FEL; BNL 61399; pres. at Lasers '94 Conf., Quebec, Canada, 12-16 December (1994);Proc. Int'l. Conf. on Lasers '94, ed. V. J. Corcoran & T. A. Goldman, STS Press, McLean, VA (1995) 253.
  33. X. J. Wang, T. Srinivasan-Rao, K. Batchelor, M. Babzien, I. Ben-Zvi, R. Malone, I. Pogorelsky, X. Qui, J. Sheehan, and J. Skaritka; Experimental Results of the ATF In-line Injection System; BNL 61743; pres. at 1995 Particle Accelerator Conf., Dallas, TX, 1-5 May (1995);Proc. 1995 Particle Accelerator Conf., pp. 890-892.

  34. A. Fisher, M. Babzien, I. Pogorelsky, and T. Srinivasan-Rao; High-stability Nd:YAG Photocathode Drive Laser; BNL 63263 ; (abs./summary); Conf. on Lasers & Electro-optics, Baltimore, MD, 23-25 May (1995); Proc. Technical Digest, Series 15, OSA Pub. 218 (1995).

  35. X. J. Wang, T. Srinivasan-Rao, K. Batchelor, I. Ben-Zvi, and J. Fischer; Measurements on Photoelectrons from a Magnesium Cathode in a Microwave Electron Gun; BNL 60356; Nucl. Instrum. & Meth. 356, (1995) 159-166.
  36. Thomas Tsang; Rotational Anisotropy in the Third-Harmonic Generation from Si; (abstract); BNL 62132; pres. Conf. on Lasers & Electro-optics, CLEO'95, 21-26 May (1995), Baltimore, MD; Technical Digest, Sec. QTu4, p. 39.

  37. Thomas Tsang; Phenomenological Surface-Enhanced Third-Harmonic Generation; (abstract) BNL 62129; pres. APS March Mtg., San Jose, CA, 20-24 March (1995); Bulletin of American Physical Soc., Vol. 40, No. 1, Sec. K16.4, p. 511.

  38. Thomas Tsang; Third-Harmonic Generation from a Simple Air-Dielectric Interface; (abstract) BNL 62131; pres. Optical Soc. of America Mtg., Portland, OR, 10-15 September (1995); Sec. WW1, Technical Digest, p. 105.

  39. V. Eremin and Z. Li; Carrier Drift Mobility Study in Neutron Irradiated High Purity Silicon; BNL 60507; pres. Int'l. Conf. on Advanced Technology & Particle Physics, Como, Italy, 3-7 October (1994); Nucl. Instrum. & Meth. A362 (1995) 338-343.
  40. Z. Li; Elevated Temperature Annealing of Bulk Resistivity of Neutron Irradiated Detector Grade Silicon Material; BNL 61421; Nucl. Instrum. & Meth. A368 (1996) 353-363.

  41. A. Pullia and H. W. Kraner; New Results in High Resolution X-ray Spectroscopy with Silicon Pad Detectors; BNL 62142; pres. 7th European Symp. on Semiconductor Detectors, Schloss, Elmau, Germany, 7-10 May (1995); not published.

  42. Z. Li, H. W. Kraner, C. J. Li, B. Nielson, H. Feick, and G. Lindstroem; Microscopic Analysis of Defects in a High Resistivity Silicon Detector Irradiated to 1.7 x 1015 cm2; BNL 61686; 1995 Nuclear Science Symp., 21-28 October (1995), San Francisco, CA; IEEE Trans. Nucl. Sci. NS-43, 1590 (1996).
  43. V. Radeka; Electronics for Calorimetry - An Overview of Requirements; BNL 62328; pres. 1st Workshop on Electronics for LHC Experiments, Lisbon, Portugal, 10-15 September (1995);Proc. of First Workshop on Electronics for LHC Experiments, pp. 235-241 (1995).

  44. J. Christopher Milne, Erik D. Johnson, and G. C. Smith; Use of Primary Electron Counting for Detection of Ultrasoft X-rays with a Low Pressure Multistep Gasesous Detector; BNL 61413; pres. 5th Int'l. Conf. on Synchrotron Radiation Instrumentation, Stony Brook, NY, 18-22 July (1994); Rev. Sci. Instrum. 66 (1995) 2330-2332.
  45. G. Bencze, A. Chikanian, M. Della Negra, V. Gratchev, H. Herve, O. Kiselev, S. McCorkle, M. Mohammadi, P. O'Connor, V. Polychronakos, O. Prokofiev, V. Radeka, E. Radermacher, C. Seez, J. Shank, G. Smith, J. Sondericker III, D. Stephani, F. Szoncso, V. Tcherniatine, A. Vanyashin, G. Walzel, S. Whitaker, G. Wrochna, C.-E. Wulz, and B. Yu; Position and Timing Resolution of Interpolatng Cathode Strip Chambers in a Test Beam; BNL 60937; Nucl. Instrum. & Meth. A367 (1995) 40-54.

  46. Yu. L. Grishkin, A. N. Martemyanov, A. Akindinov, M. M. Chumakov, O. I. Pogorelko, S. Posdnyakov, P. N. Shiskov, V. I. Ushakov, B. Kross, S. Majewski, A. Weisenberger, R. Wojcik, O. K. Baker, I. Hwang, D. Lyons, G. Niculescu, I. M. Niculescu, G. Smith, P. Geltenbort, and A. Oed; Preliminary Study of a New Type of Gas Microstrip Chamber on a Sapphire Substrate; BNL 62692 ; Nucl. Instrum. & Meth. A354 (1995) 309-317.
  47. X. J. Wang, M. Babzien, K. Batchelor, I. Ben-Zvi, R. Malone, I. Pogorelsky, X. Qui, J. Sheehan, J. Sharitka, and T. Srinivasan-Rao; Experimental Characterization of High-Brightness Electron Photoinjector; BNL 61982 ; pres. FEL'95 Conf., 21-25 August (1995), New York, NY; Nucl. Instrum. & Meth. A375 (1996) 82-86.

  48. P. O'Connor; Front-End Electronics Development at BNL; BNL 62380; pres. Int'l. Workshop on Analog Front-End VLSI Electronics for Radiation Imagaing Detectors, Marathon, Greece, 28-30 September (1995);(not published).

  49. Anand Kandasamy; Serial Interface Controller; BNL 62408; (1995); informal report (not published).

  50. Mauro Citterio, James Kierstead, Sergio Rescia, and Veljko Radeka; Radiation Effects on Si-JFET Devices for Front-End Electronics; BNL 62452 ; pres. 1995 Nuclear Science Symp., San Francisco, CA, 21-28 October (1995); IEEE Trans. Nucl. Sci. NS-43, No. 3, June (1996) 1576-1584.

  51. X. J. Wang, T. Srinivasan-Rao, K. Batchelor, M. Babzien, I. Ben-Zvi, J. Fischer, R. Malone, I. Pogorelsky, X. Qui, J. Sheehan, and J. Sharitka; High Brightness Electron Beam Generation Using Emittance Compensation in a High-Gradient Photocathode RF Gun; BNL 62336; sub. Phys. Rev. Lett. (8/95); not published.

  52. T. Srinivasan-Rao, J. Yu, and X. J. Wang; Study on the Sensitivity of Quantum Efficiency of Copper Photocathodes on Sample Preparation; BNL 62626; not published.

  53. J. A. Mead and T. J. Shea; A DSP Based Data Acquisition Module for Colliding Beam Accelerators; BNL 62887; pres. 6th Int'l. Conf. on Signal Processing Applications and Technology, Boston, MA, 10/24-24/95; Proc. 6th Int'l. Conf. on Signal Processing Applications & Technology, pp. 455-459 (1995).

  54. F. Lanni, P. F. Manfredi, V. Radeka, V. Re, S. Rescia, and V. Speziali; Monolithic Silicon JFET Front-End Calorimetry; BNL 62950; Nucl. Instrum. & Meth. A360 (1995) 158-161.

  55. A . Castoldi and P. Rehak; Electron Drift Time in Silicon Drift Detectors: A Technique for High Precision Measurement of Electron Drift Mobility; BNL 63056; Rev. Sci. Instrum. 66(10) October (1995) 4989-4995.

  56. M. Sampietro, L. Fasoli, P. Rehak, and L. Struder; Novel p-JFET Embedded in Silicon Radiation Detectors that Avoids Preamplifier Feedback Resistor; BNL 63073; IEEE Electron Device Letters, Vol. 16, No. 5, May (1995) 208-210.



Last Modified: Wednesday, 06-Feb-2013 22:33:56 EST