Instrumentation Publications - 1999



  1. S. U. Pandey, P. Middelkamp, Z. Li, and V. Eremin; New Experimental and Analysis Methods in I-DLTS; BNL 65290; pres. 2nd Int'l. Conf. on Radiation Effects on Semiconductor Materials, Detectors, and Devices, Florence, Italy, 4-6 March (1998); Nucl. Instrum. & Meth. A426 (1999) 109-113.

  2. B. Dezillie, V. Eremin, Z. Li, and E. Verbitskaya; Defect Analysis of Silicon Detector Made of Different Materials for Radiation Hardness; BNL 65394 ; pres. 2nd Int'l. Conf. on Radiation Effects on Semiconductor Materials, Detectors & Devices, 4-6 March (1998), Florence, Italy; Nucl. Instrum. & Meth. A426 (1999) 114-119.

  3. Zheng Li, B. Dezillie, V. Eremin, C-J. Li, and E. Verbitskaya; First Charge Collection and Position Precision Data on the Medium Resistivity Silicon Strip Detectors Before and After Neutron Irradiation up to 2 x 10^14 n/cm^2; BNL 65392; pres. 2nd Int'l. Conf. on Radiation Effects in Semiconductor Materials, Detectors, & Devices, Florence, Italy, 4-6 March (1998); Nucl. Instrum. & Meth. A426 (1999) 38-46.

  4. T. Dubbs, W. Kroeger, T. Nissen, T. Pulliam, H.F-W. Sadrozinski, B. Dezillie, Z. Li, Q. S. Wang, and L. J. Zhao; Depletion Voltage and Charge Collection for Highly Irradiated Silicon Microstrip Detectors with Various Initial Resistivities; BNL 65400; IEEE Trans. Nucl. Sci., Vol. 46, No. 6 (1999) 1964-1968.

  5. W. Chen, C.Y. Chien, B. Dezillie, V. Eremin, Z. Li, D. Menichelli, and X. Xie; Electrical Characterization of Irradiated Medium Resistivity n+/n/p+ Pixel Detectors; BNL 65440 ; pres. 2nd Int'l. Conf. on Radiation Effects in Semiconductor Materials, Detectors, & Devices, Florence, Italy, 4-6 March (1998); Nucl. Instrum. & Meth. A426 (1999) 47-50.

  6. U. Biggeri, E. Borchi, M. Bruzzi, B. Dezillie, Z. Li, S. Pirollo, and S. Sciortino; Hall Effect Analysis in Neutron Irradiated Silicon Samples with Different Resistivities; BNL 65457; pres. 1998 Nuclear Science Symp., Toronto, Canada, 8-14 November (1998); IEEE Trans. Nucl. Sci. 46, No. 3 (1999) 834-838.

  7. B. Dezillie, Z. Li, and M. Bruzzi; Diode and Resistor Studies on Neutron Irradiated Silicon Samples with Different Starting Resistivities; BNL 65455 ; pres. 1998 Nuclear Science Symp., Toronto, Canada, 8-14 November (1998); IEEE Trans. Nucl. Sci., Vol. 46, No. 3, (1999) 221-227.

  8. G.J. Mahler, V. Radeka, N. A. Schaknowski, G. C. Smith, B. Yu, and Z. Zojceski; A New Thermal Neutron Detector for Protein Crystallography; BNL 65495 ; pres. 1998 Nuclear Science Symp., Toronto, Canada, 8-14 November (1998); IEEE Trans. Nucl. Sci. NS-46 (1999) 1916-1919.

  9. B. Yu, G. C. Smith, D. P. Siddons, P. J. Pietraski, and Z. Zojceski; Position Sensitive Gas Proportional Detectors with Anode Blades; BNL 65497; pres. 1998 Nuclear Science Symp., Toronto, Canada, 8-14 November (1998); IEEE Trans. Nucl. Sci. NS-46, No. 3, June (1999) 338-341.

  10. P. J. Pietraski, Z. Zojceski, D. P. Siddons, G. C. Smith, and B. Yu; Digital Centroid-Finding Electronics for High-Rate Detectors; BNL 65496 ; pres. 1998 Nuclear Science Symp., Toronto, Canada, 8-14 November (1998); IEEE Trans. Nucl. Sci. NS-46 (1999) 810-816.

  11. D. Menichelli, M. Bruzzi, Z. Li, and V. Eremin; Modeling of Observed Double Junction Effect; BNL 65456; pres. 2nd Int'l. Conf. on Radiation Effects in Semiconductor Materials, Detectors, & Devices, 4-6 March (1998), Florence, Italy; Nucl. Instrum. & Meth. A426 (1999) 135-139.

  12. Gianluigi De Geronimo and Paul O'Connor; A CMOS Detector Leakage Current Self-Adaptable Continuous Reset System: Theoretical Analysis; BNL 65574; Nucl. Instrum. & Meth. A421 (1999) 322-333

  13. G. Bolla, D. Bortoletto, G. P. Grim, R. L. Lander, Z. Li, and S. Willard; First Results on Radiation Damage Studies Using n+/p/p+ Diodes Fabricated with Multi-Guard Ring Structures. Revision 1.2; BNL 65626 ; Nucl. Instrum. & Meth. A435(1999) 178-186.

  14. S. Tudisco, F. Amorini, M. Cabibbo, G. Cardella, G. De Geronimo, A. Di Pietro, G. Fallica, P. Figuera, A. Musumarra, M. Papa, G. Pappalardo, F. Rizzo, & G. Valvo; A New Large Area Monolithic Silicon Telescope; BNL 65790 ; Nucl. Instrum. & Meth. A426 (1999) 436-445.

  15. Peter Z. Takacs, Eugene L. Church, Cynthia Bresloff, and Lahsen Assoufid; Long Trace Profiler Measurement Repeatability Improvements; BNL 65874; Applied Optics Vol. 38, No. 25 (1 September 1999) 5468-5479.

  16. Shinan Qian and Peter Takacs; Sub-microrad Angular Stability Measurements in Long-Trace-Profiler-Based Systems; BNL 66140; presented at The International Symp. on Optical Science, Engineering, and Instrumentation, 18-23 July (1999), Denver, CO; Proc. SPIE, Vol. 3773, pp. 158-166 (1999).

  17. Peter Z. Takacs, Shinan Qian, and Haizhang Li; Synchrotron Radiation and X-ray Mirror Metrology with the Long Trace Profiler; BNL 66215; in Fabrication and Testing of Aspheres, Vol. 24 of OSA Trends in Optics & Photonics Series (TOPS), A. Lindquist, M. Piscotty, and J.S. Taylor, eds., Optical Soc. of America (1999).

  18. Plamen V. Kolev, M. Jamal Deen, James Kierstead, and Mauro Citterio; Constant-Resistance Deep-Level Transient Spectroscopy in Si and Ge JFETs; BNL 66247; IEEE Trans. Nucl. Sci. Vol. 46, No. 1, January (1999) 204-213.

  19. T. Srinivasan-Rao, J. Schill, I. Ben-Zvi, K. Batchelor, J.P. Farrell, J. Smedley, X.E. Lin, and A. Odian; Simulation, Generation, and Characterization of High Brightness Electron Source at 1 GV/m Gradient; BNL 66464; pres. PAC'99 Conf., New York, NY, 3/29-4/2/99; Proc. 1999 Particle Accelerator Conf., Eds. A. Luccio & W. Mackay, p. 75 (1999).

  20. John A. Nation, Levi Schachter, Frederick M. Mako, L. K. Len, William Peter, Cha-Mei Tang, and Triveni Srinivasan-Rao; Advances in Cold Cathode Physics and Technology; BNL 66487; Proc. IEEE, Vol. 87, No. 5, May (1999) 865-889.

  21. P. Rehak, G. C. Smith, J. B. Warren, and B. Yu; Micro Pin Array Detector (MIPA): First Test Results; BNL 66497; pres. at Micro-Pattern Gas Detectors Workshop, Orsay, France, 28-30 June (1999); Proc. Int'l. Workshop on Micro-Pattern Gas Detectors, pp. 119-123 (1999).

  22. Peter Z. Takacs; Nanometer Precision in Large Surface Profilometry; BNL 66587; invited paper pres. at 9th Int'l. Conf. on Production Engineering, Osaka, Japan, 8/30-9/1/99; in Precision Science and Technology for Perfect Studies, pp. 301-310, Japan Soc. For Precision Engineering (1999).

  23. Peter Z.Takacs; Prediction and In-Situ Measurement of Thermal Deformation of Cooled Synchrotron X-ray Mirrors; (abstract): BNL 66614; pres. 11th U.S. National Synchrotron Radiation Instrumentation Conf. (SRI99), SLAC, Stanford, CA, 13-15 October (1999); oral presentation (not published).

  24. A. Kandasamy, E. O'Brien, P. O'Connor, and W. Von Achen; A Monolithic Preamplfier -Shaper for Measruement of Energy Loss and Transition Radiation; BNL 66629; pres. 1998 Nuclear Science Symp., Toronto, Canada, 8-14 November (1998); IEEE Trans. Nucl. Sci. NS-46, No. 3, June (1999) 150-155.

  25. G. De Geronimo and P. O'Connor; A Novel CMOS Class AB Rail-to-Rail Output Stage; (abstract/summary); BNL 66634; pres. 1999 Nuclear Science Symp., Seattle, WA, 26-28 October (1999);

  26. P. O'Connor, V. Gratchev, A. Kandasamy, V. Polychronakos, V. Tcherniatine, J. Parsons, and W. Sippach; Readout Electronics for a High-Rate CSC Detector; BNL 66642; pres. at 1999 LHC Electronics Workshop, Snowmass, CO, 25-28 September (1999); Proc. 5th Workshop on Electronics for LHC Experiments, CERN 99-09, CERN/LHCC/99-33, pp. 452-456 (1999).

  27. S. Sostero, D. Cocco, and S.N. Qian; Metrological Challenges of Synchrotron Radiation Optics; BNL 66662; pres. EUROPTO, Berlin, Germany, 25-28 May (1999); Proc. SPIE, Vol. 3739, pp. 310-316 (1999).

  28. D. P. Siddons, L. Furenlid, P. Pietraski, Z. Yin, Z. Li, G. Smith, B. Yu, and R. Harlow; Instrumentation Developments for X-ray Powder Diffraction at Brookhaven; BNL 66604; Synchrotron Radiation News, Vol. 12, No. 4 (1999) 21-26.

  29. Peter Z.Takacs, Shinan Qian, Thomas Kester, and Haizhang Li; Large-Mirror Figure Measurement by Optical Profilometry Techniques; BNL 66742; pres. SPIE Int'l. Symp. On Optical Science & Engineering, 18-23 July (1999), Denver, CO; in Optical Manufacturing and Testing III, H. Phil Stahl, ed., Proc. SPIE 3782 (1999).

  30. E. L. Church and P. Z. Takacs; The Testing of Glancing Incidence Mirrors Using Sampled Profile Measurements; BNL 67197; invited paper pres. at SPIE In'tl. Symp. On Optical Science and Engineering, 21-23 July (1999), Denver, CO; EUV, X-ray, and Neutron Optics and Sources, vol. 3767, pp. 121-134 (1999).

  31. R. Soufli, P. Z. Takacs, and D. E. Graessle; Scattering and Profilometry Studies for Surface Characterization of CXO Iridium Witness Mirrors; (abstract) BNL 67200; oral presentation (no paper) at SPIE Int'l. Symp. On Optical Science and Engineering, Denver, CO, 18-20 July (1999); X-ray Optics, Instruments, and Missions II, vol.

  32. M. P. Ulmer, R. Altkorn, A. Madan, M. Graham, Y.-W. Chung, A. Krieger, C. Liu, B. P. Lai, D. C. Mancini, and P. Z. Takacs; The Fabrication of Wolter I Multilayer Coated Optics via Electroforming: An Update; BNL 67196; pres. at SPIE Int'l. Symp. On Optical Science, Engineering, and Instrumentation, Denver, CO, 20-21 July (1999); X-ray Optics Design, Performance, and Applications, vol. 3773, pp. 113-121 (1999).

  33. B. Dezillie, Z. Li, V. Eremin, M. Bruzzi, S. Pirollo, S.U. Pandey, and C.J. Li; Improved Neutron Radiation Hardness for Si Detectors: Application of Low Resistivity Starting Material and/or Manipulation of Neff by Selective Filling of Radiation-Induced Traps at Low Temperatures; BNL 67390; IEEE Trans. Nucl. Sci. Vol. 46, No. 3, June (1999) 221-227.

  34. R.L. Chase, M. Citterio, F. Lanni, D. Makowiecki, V. Radeka, S. Rescia, H. Takai, J. Ban, J. Parsons, and W. Sippach; Characterization of the Coherent Noise, Electromagnetic Compatibility and Electromagnetic Interference of the ATLAS EM Calorimeter Front End Board; BNL 67429; Proc. 5th Workshop on Electronics for LHC Experiments, Snowmass, CO, 20-24 September (1999), CERN 99-09, CERN/LHCC/99-93, pp. 222-226.

  35. P. Cameron, R. Connolly, R. Michnoff, V. Radeka, W. Ryan, T. Shea, R. Sikora, D. Stephani, S. Tepikian, N. Tsoupas, and L. Woodworth; The RHIC Ionization Beam Profile Monitor; BNL 66048; Proc. 1999 Particle Accelerator Conf., New York, NY, (1999) pp. 2114-2116.

  36. B. Panessa-Warren, George T. Tortora, J. Warren, and R. Sabatini; Thermophile Endospores Have Responsive Exosporium for Attachment; BNL 67524; pres. At Microscopy and Microanalysis Conf., Portland, OR, August (1999); Proc. Of Microscopy and Microanalysis Conf., pp. 310-311 (1999), San Francisco Press, San Francisco, CA.

  37. S. Rankowitz et al.; New Measurement of the Anomalous Magnetic Moment of the Positive Muon; BNL 67551; Phys. Rev. Letts. Vol. 82, No. 8, 22 February (1999) 1632-1635.

  38. RD39 Collaboration (Z. Li); Charge Collection Efficiency Recovery in Heavily Irradiated Silicon Detectors Operated at Cryogenic Temperatures; BNL ; IEEE Trans. Nucl. Sci. Vol. 46, No. 4 (1999) 298-30.



Last Modified: Wednesday, 06-Feb-2013 22:33:56 EST